Four-probe sheet resistance measurement - QuickField simulation example
Four-probe method is used to measure the thin sheet resistance. This method is similar to a Wenner array method. But here we deal with a limited in size specimen. So the corrections to the equation should be made [1]. We use a finite element model to verify these equations.
How to calculate sheet resistance from a four-probe measurement?
Answer Typical applications Geometry
Given
Task
Solution
Four-point probe equation for surface resistivity is ρs = (V / I) * C(a/d;d/s), where C(2;10) = 4.2357 in accordance with [1].
Results
Reference
Engineering question
Convert sheet resistance and film thickness to conductivity, inject the specified current through the outer probes, keep the voltage probes floating, and measure their potential difference.
four-probe resistivity samples, thin conductive sheets, semiconductor wafers
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Simulation problem
Problem Type
Plane-parallel problem of DC conduction.
d = 100 mm, a = 200 mm, s = 10 mm.
Surface electric resistance of the film is Rs = 10 Ω/square, film thickness is t = 200 nm.
Electrodes spacing s = 20 mm, injected current I = 4.5 mA.
Calculate the electric potential difference between electrodes 1 and 2.
For the film we should specify electrical conductivity, which is reciprocal to the product of surface resistance and the film thickness: σ = 1/(Rs*t) = 1/ (10 * 200e-9) = 0.5 MS/m.
The electrode conductivity is much higher than that of the film. We model electrodes by specifying their electric potentials and current density on the electrode surfaces.
Electrode tip diameter is 1 mm. In QuickField we specify current density at (I+) electrode 0.0045 / (PI*0.001/2) / 200e-9. At the (I-) electrode we specify zero electric potential. Electrodes (1) and (2) are floating conductors.
Potential difference between electrodes 1 and 2 is 0.0356-0.0249 = 0.0107 V. Following the analytical equation the resistivity is ρs = (0.0107/0.0045)*4.2357 = 10.07 Ω/square. This shows that the finite element simulation result agrees with the analytical approach with 0.7% tolerance.
F. M. Smits Measurement of sheet resistivities with the four-point probe, The Bell System Technical Journal, vol. 37, no. 3, pp. 711-718, May 1958.
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